BEAM CHOPPER FOR SUB-NANOSECOND PULSES IN SCANNING ELECTRON-MICROSCOPY

[1] BALK LJ, 1976, P SEM, P615

[2] DEFLECTION BEAM-CHOPPING IN SEM [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (03): : 229 - 236

[3] GOPINATH A, 1974, 7TH P A SEM S CHIC, P235

[4] Hieke E., 1977, Proceedings of the 10th Annual Scanning Electron Microscopy Symposium, P219

[5] LUKIANOFF GV, 1975, 8TH P A SEM S CHIC, P465

[6] TIME-RESOLVED SCANNING ELECTRON MICROSCOPY AND ITS APPLICATION TO BULK-EFFECT OSCILLATORS [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (11) : 4516 - +

[7] NAKAMURA T, 1965, PAPERS TECHNICAL GRO

[8] ROTATIONALLY SYMMETRIC ELECTRON-BEAM CHOPPER FOR PICOSECOND PULSES [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (06): : 455 - 463

[9] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &

[10] ELECTRON-GUN FOR GENERATION OF SUBNANOSECOND ELECTRON PACKETS AT VERY HIGH REPETITION RATE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (04) : 412 - 417

[1] BALK LJ, 1976, P SEM, P615

[2] DEFLECTION BEAM-CHOPPING IN SEM [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (03): : 229 - 236

[3] GOPINATH A, 1974, 7TH P A SEM S CHIC, P235

[4] Hieke E., 1977, Proceedings of the 10th Annual Scanning Electron Microscopy Symposium, P219

[5] LUKIANOFF GV, 1975, 8TH P A SEM S CHIC, P465

[6] TIME-RESOLVED SCANNING ELECTRON MICROSCOPY AND ITS APPLICATION TO BULK-EFFECT OSCILLATORS [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (11) : 4516 - +

[7] NAKAMURA T, 1965, PAPERS TECHNICAL GRO

[8] ROTATIONALLY SYMMETRIC ELECTRON-BEAM CHOPPER FOR PICOSECOND PULSES [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (06): : 455 - 463

[9] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &

[10] ELECTRON-GUN FOR GENERATION OF SUBNANOSECOND ELECTRON PACKETS AT VERY HIGH REPETITION RATE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (04) : 412 - 417