STRUCTURE ANALYSES COMBINING ELECTRON DIFFRACTION AND MICROWAVE DATA .1. STUDY OF XEOF4

被引：31

作者：

JACOB, EJ

THOMPSON, HB

BARTELL, LS

机构：

来源：

关键词：

D O I：

10.1016/0022-2860(71)80016-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：383 / &

共 21 条

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