ANGULAR MAGNETORESISTANCE PROVIDES TEXTURE INFORMATION ON HIGH-TC CONDUCTORS

被引:5
作者
BERDAHL, P
MAO, XL
READE, RP
RUBIN, MD
RUSSO, RE
YIN, E
机构
[1] Lawrence Berkeley Laboratory, Berkeley
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1992年 / 195卷 / 1-2期
关键词
D O I
10.1016/0921-4534(92)90079-R
中图分类号
O59 [应用物理学];
学科分类号
摘要
Angular magnetoresistance measurements are performed by rotating a superconductor to an angle-theta in a fixed magnetic field, while monitoring the resistance R. It is argued theoretically that for fields well above the lower critical field, H much greater than H(cl), the bulk resistivity of the conductor is independent of theta if the crystallites of which it is composed are randomly oriented. Non-random orientation (a key aspect of texture) is revealed, therefore, by variations of R with theta. Dips in R indicate that the field is parallel to the copper oxide planes in a significant fraction of the current-carrying crystallites. C-axis, a-axis, and other textured film conductors are used to illustrate the technique. The angular magnetoresistance is found to be an important supplement to conventional texture determinations by microscopy and X-ray diffraction.
引用
收藏
页码:93 / 102
页数:10
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