THE MEASUREMENT OF ALPHA-PARTICLE EMISSIONS FROM SEMICONDUCTOR MEMORY MATERIALS

被引:13
作者
BOULDIN, DP
机构
关键词
D O I
10.1007/BF02660131
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:747 / 795
页数:49
相关论文
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