ANISOTROPIC PROPERTIES OF THE HIGH-QUALITY EPITAXIAL YBA2CU3O7-DELTA(110) THIN-FILM

被引：38

作者：

WU, JZ ^{[1
]}

HSIEH, PY ^{[1
]}

MCGUIRE, AV ^{[1
]}

SCHMIDT, DL ^{[1
]}

WOOD, LT ^{[1
]}

SHEN, Y ^{[1
]}

CHU, WK ^{[1
]}

机构：

[1] UNIV HOUSTON,DEPT PHYS,HOUSTON,TX 77204

来源：

PHYSICAL REVIEW B | 1991年 / 44卷 / 22期

关键词：

D O I：

10.1103/PhysRevB.44.12643

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-quality (T(c) approximately 86 K and phase purity > 99%) epitaxial YBa2Cu3O7-delta(110) thin films have been obtained by inverted-cylindrical-magnetron-sputtering deposition on a single crystal (110) SrTiO3 substrate. A unique feature of this film is the in-plane alignment of the c axis of the YBa2Cu3O7-delta-film in a single direction, which is very important for the study of the anisotropy in this material. The crystal orientation of the film has been investigated using x-ray diffraction to collect pole figures. Our resistivity and optical-reflectivity measurements have revealed pronounced anisotropic behavior.

引用

页码：12643 / 12646

页数：4

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