LOW-ENERGY ELECTRON AND ION PROJECTION MICROSCOPY

被引：60

作者：

STOCKER, W ^{[1
]}

FINK, HW ^{[1
]}

MORIN, R ^{[1
]}

机构：

[1] CNRS,CRMC2,F-13288 MARSEILLE,FRANCE

来源：

关键词：

D O I：

10.1016/0304-3991(89)90336-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：379 / 384

页数：6

共 7 条

[1] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[2] BOERSCH H, 1939, Z TECHN PHYS, V12, P346
[3] POINT-SOURCE FOR IONS AND ELECTRONS
FINK, HW
[J]. PHYSICA SCRIPTA, 1988, 38 (02): : 260 - 263
[4] THEORY OF A SINGLE-ATOM POINT-SOURCE FOR ELECTRONS
LANG, ND
YACOBY, A
IMRY, Y
[J]. PHYSICAL REVIEW LETTERS, 1989, 63 (14) : 1499 - 1502
[5] FIELD EMISSION SHADOW MICROSCOPY
MELMED, AJ
[J]. APPLIED PHYSICS LETTERS, 1968, 12 (03) : 100 - &
[6] Point projector electron microscope
Morton, GA
Ramberg, EG
[J]. PHYSICAL REVIEW, 1939, 56 (07): : 705 - 705
[7] MUELLER E, 1969, FIELD ION MICROSCOPY, P129