GOODNESS-OF-FIT TEST FOR EXTREME-VALUE DISTRIBUTION

被引：4

作者：

TSUJITANI, M

OHTA, H

KASE, S

机构：

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1980年 / 29卷 / 02期

关键词：

D O I：

10.1109/TR.1980.5220760

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：151 / 153

页数：3

共 11 条

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[4]

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[6] ON KOLMOGOROV-SMIRNOV TEST FOR EXPONENTIAL DISTRIBUTION WITH MEAN UNKNOWN [J].

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[7]

Mann N.R., 1973, COMMUN STAT, V2, P383, DOI DOI 10.1080/03610927308827085

[8] GOODNESS-OF-FIT TEST FOR 2 PARAMETER VS 3 PARAMETER WEIBULL - CONFIDENCE BOUNDS FOR THRESHOLD [J].

MANN, NR ;

FERTIG, KW .

TECHNOMETRICS, 1975, 17 (02) :237-245

[9] EDF STATISTICS FOR GOODNESS OF FIT AND SOME COMPARISONS [J].

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[10]

VASICEK O, 1976, J R STAT SOC B, V38, P54

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