PHASE INTERGROWTH IN BI2SR2CAN-1CUNOY THIN-FILMS

被引：57

作者：

RANNO, L

MARTINEZGARCIA, D

PERRIERE, J

BARBOUX, P

机构：

[1] UNIV PARIS 06, PHYS SOLIDES GRP, F-75251 PARIS 5, FRANCE

[2] UNIV PARIS 06, CHIM MAT CONDENSEE LAB, URA 1466, F-75252 PARIS 5, FRANCE

来源：

PHYSICAL REVIEW B | 1993年 / 48卷 / 18期

关键词：

D O I：

10.1103/PhysRevB.48.13945

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The presence of phase intergrowth in Bi-Sr-Ca-Cu-O thin films, in situ grown using a laser-ablation technique, has been investigated. A simple intergrowth model has been used to analyze the experimental x-ray-diffraction patterns of the films and has allowed us to measure the stacking-fault proportion in the films. Rutherford-backscattering spectrometry (RBS) has also been used in order to determine the cationic composition. The Bi/Cu ratio obtained by x-ray-diffraction analysis is in very good agreement with the results of RBS analysis. The intergrowth phenomenon allows one to change the structure continuously from one pure phase to another one, a fact that is experimentally observed when the oxygen pressure during deposition is changed.

引用

页码：13945 / 13948

页数：4

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