X-ray diffraction measurements on metallic and semiconducting hexagonal NiS

被引:89
作者
Trahan, Jeffrey [1 ]
Goodrich, R. G.
Watkins, S. F.
机构
[1] Louisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USA
[2] Louisiana State Univ, Coates Chem Lab, Baton Rouge, LA 70803 USA
来源
PHYSICAL REVIEW B-SOLID STATE | 1970年 / 2卷 / 08期
关键词
D O I
10.1103/PhysRevB.2.2859
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The crystallographic structure of hexagonal Nis has been determined at temperatures above and below the metal-semiconducting transition. The powder x-ray diffraction peak intensities were used to determine the atom positions in both phases. The symmetry of the unit cell is found to change from P6(3)/mmc(D-6h(4)) in the metallic phase to P6(3)mc(C-6v(4)) in the semiconducting phase.
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页码:2859 / 2863
页数:5
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