X-ray diffraction measurements on metallic and semiconducting hexagonal NiS
被引:89
作者:
Trahan, Jeffrey
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机构:
Louisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USALouisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USA
Trahan, Jeffrey
[1
]
Goodrich, R. G.
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h-index: 0
机构:Louisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USA
Goodrich, R. G.
Watkins, S. F.
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h-index: 0
机构:Louisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USA
Watkins, S. F.
机构:
[1] Louisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USA
[2] Louisiana State Univ, Coates Chem Lab, Baton Rouge, LA 70803 USA
来源:
PHYSICAL REVIEW B-SOLID STATE
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1970年
/
2卷
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08期
关键词:
D O I:
10.1103/PhysRevB.2.2859
中图分类号:
O469 [凝聚态物理学];
学科分类号:
070205 ;
摘要:
The crystallographic structure of hexagonal Nis has been determined at temperatures above and below the metal-semiconducting transition. The powder x-ray diffraction peak intensities were used to determine the atom positions in both phases. The symmetry of the unit cell is found to change from P6(3)/mmc(D-6h(4)) in the metallic phase to P6(3)mc(C-6v(4)) in the semiconducting phase.