METHODS OF MATHEMATICAL MORPHOLOGY IN SPATIAL-ANALYSIS OF ISLAND METAL-FILMS

被引：14

作者：

HRACH, R

SOBOTKA, M

机构：

[1] Department of Electronics and Vacuum Physics, Praha 8, 18000

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1990年 / 69卷 / 01期

关键词：

D O I：

10.1080/00207219008920290

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The applicability or various morphological methods (radial distribution function, contact distribution function, distribution of nearest neighbours in two modifcations, quadratic counts, covariance and chord length distribution) for the analysis of metal island films, is tested by computer experiment. All these methods are also applied to experimental data on In and Ag films. © 1990 Taylor & Francis Ltd.

引用

页码：49 / 54

页数：6