DIFFRACTION ANOMALOUS FINE-STRUCTURE - A NEW X-RAY STRUCTURAL TECHNIQUE

被引：189

作者：

STRAGIER, H ^{[1
]}

CROSS, JO ^{[1
]}

REHR, JJ ^{[1
]}

SORENSEN, LB ^{[1
]}

BOULDIN, CE ^{[1
]}

WOICIK, JC ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL,GAITHERSBURG,MD 20899

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 69卷 / 21期

关键词：

D O I：

10.1103/PhysRevLett.69.3064

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new x-ray structural technique, diffraction anomalous fine structure (DAFS), which combines the long-range order sensitivity of diffraction techniques with the short-range order sensitivity of absorption techniques, is described. We demonstrate that synchrotron DAFS measurements for the Cu(111) and Cu(222) Bragg reflections provide the same local atomic structural information as x-ray absorption fine structure and describe how DAFS can be used to provide enhanced site and spatial sensitivities for polyatomic and/or spatially modulated structures.

引用

页码：3064 / 3067

页数：4

共 13 条

[1]

ARCON I, 1987, J PHYS-PARIS, V48, P1105

[2] MAGNETIC SCATTERING OF X-RAYS [J].

BLUME, M .

JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) :3615-3618

[3]

CAUCHOIS Y, 1956, CR HEBD ACAD SCI, V242, P1596

[4] The quantum theory of dispersion [J].

Dirac, PAM .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1927, 114 (769) :710-728

[5] The quantum theory of the emission and absorption of radiation [J].

Dirac, PAM .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1927, 114 (767) :243-265

[6] X-RAY ANOMALOUS SCATTERING FACTORS FOR SILICON AND GERMANIUM [J].

GERWARD, L ;

THUESEN, G ;

JENSEN, MS ;

ALSTRUP, I .

ACTA CRYSTALLOGRAPHICA SECTION A, 1979, 35 (SEP) :852-857

[7]

Prins R, 1988, XRAY ABSORPTION PRIN

[8]

SALEM SI, 1980, J PHYS F MET PHYS, V10, P1967

[9]

STRAGIER H, IN PRESS

[10]

Templeton D H., 1991, HDB SYNCHROTRON RAD, V3

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