LIFETIME MEASUREMENTS ON STEP-RECOVERY DIODES USING SINUSOIDAL INPUT

被引：4

作者：

ROULSTON, DJ

HANSON, J

机构：

[1] Dept. of Elec. Engrg., University of Waterloo, Waterloo, Ontario

来源：

PROCEEDINGS OF THE IEEE | 1969年 / 57卷 / 06期

关键词：

D O I：

10.1109/PROC.1969.7193

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

By applying a sinusoidal voltage of known frequency to a p-n-n-n-n structure of narrow n region and adjusting the dc bias to optimize the output component of a given harmonic in a resistive circuit, the lifetime may be obtained directly from a given set of computed curves Copyright © 1969 by The Inshtute of Electrical and Electronics Engineers Inc.

引用

页码：1201 / &

共 6 条

[1]

CHILVERS PWC, 1966, ELECTRON LETTERS, V2, P108

[2] HARMONIC GENERATION - RECTIFICATION - AND LIFETIME EVALUATION WITH STEP RECOVERY DIODE [J].

KRAKAUER, SM .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1962, 50 (07) :1665-&

[3] GENERATION OF HARMONICS AND SUBHARMONICS AT MICROWAVE FREQUENCIES WITH P-N JUNCTION DIODES [J].

LEENOV, D ;

UHLIR, A .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1959, 47 (10) :1724-1729

[4]

LINDMAYER, 1966, FUNDAMENTALS SEMICON, pCH8

[5]

Moll J. L., 1962, P IRE, V50, P43

[6] EFFECT OF FINITE RECOVERY TIME ON CHARGE-STORAGE DIODE FREQUENCY MULTIPLIERS [J].

ROULSTON, DJ .

ELECTRONICS LETTERS, 1967, 3 (05) :190-&

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