DEPOSITION AND CHARACTERIZATION OF Y-BA-CU-O THIN-FILMS ON SILICON SUBSTRATES - INTERFACE ANALYSIS

被引：7

作者：

FENNER, DB

FORK, DK

BOYCE, JB

CONNELL, GAN

VIANO, AM

机构：

[1] UNIV SANTA CLARA,DEPT PHYS,SANTA CLARA,CA 95053

[2] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

PHYSICA C | 1989年 / 162卷

关键词：

D O I：

10.1016/0921-4534(89)90957-X

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：141 / 142

页数：2

相关论文

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[3] FORK DK, 1989, PHYSICA C, V162
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