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PERFORMANCE OF AN AMPLITUDE FOURIER SPECTROMETER FOR FAR-INFRARED SOLID-STATE SPECTROSCOPY

被引：15
作者：
GAST, J
GENZEL, L
ZWICK, U
机构：
[1] BRUKER PHYS AG,KARLSRUHE,FED REP GER
[2] MAX PLANCK INST FESTKORPER FORSCH,STUTTGART,FED REP GER
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1974年 / MT22卷 / 12期
关键词：
D O I：
10.1109/TMTT.1974.1128420
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1026 / 1027
页数：2
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