DETERMINATION OF TRACE-ELEMENTS IN SILICATE MATRICES BY DIFFERENTIAL CATHODE-RAY POLAROGRAPHY

被引：9

作者：

MAIENTHAL, EJ ^{[1
]}

机构：

[1] NATL BUR STAND, ANAL CHEM DIV, ELECTROCHEM ANAL, WASHINGTON, DC 20234 USA

来源：

关键词：

D O I：

10.1021/ac60326a012

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：644 / 648

页数：5

共 10 条

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[6]

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[7]

MAIENTHAL EJ, 1969, NBS505 TECH NOT, P17

[8]

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[9]

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[10]

1972, SRMS610619 NBS OFF S