LASER DAMAGE THRESHOLD FOR DIELECTRIC COATINGS AS DETERMINED BY INCLUSIONS

被引：30

作者：

MILAM, D

BRADBURY, RA

BASS, M

机构：

[1] USAF,CAMBRIDGE RES LABS,LASER PHYS BRANCH,LG HANSCOM FIELD,BEDFORD,MA 01730

[2] RAYTHEON CO,RES DIV,WALTHAM,MA 02154

来源：

关键词：

D O I：

10.1063/1.1654780

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：654 / 657

页数：4

共 13 条

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[2]

Bliss E. S., 1971, Opto-Electronics, V3, P99, DOI 10.1007/BF01424087

[3]

BLISS ES, 1973, APPL OPT, V12, P602

[4]

BLISS ES, 1972, 720233 AIR FORC CAMB

[5]

BLISS ES, 1972, NBS372 SPEC PUBL

[6]

DESHAZER LG, F1962871C0220QTR CON

[7]

DESHAZER LG, 1973, 5 P ASTMNBS S DAM LA

FRADIN, DW ;

YABLONOVITCH, E ;

BASS, M .

[9] MECHANISM OF INCLUSION DAMAGE IN LASER GLASS [J].

HOPPER, RW ;

UHLMANN, DR .

[10]

MILAM D, 1973, 5 P ASTMNBS S DAM LA