学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
STANDBY REDUNDANT COMPLEX SYSTEM WITH IMPERFECT SWITCH
被引:1
作者
:
GUPTA, RK
论文数:
0
引用数:
0
h-index:
0
机构:
USSV POSTGRAD COLL,HAPUR,INDIA
USSV POSTGRAD COLL,HAPUR,INDIA
GUPTA, RK
[
1
]
机构
:
[1]
USSV POSTGRAD COLL,HAPUR,INDIA
来源
:
IEEE TRANSACTIONS ON RELIABILITY
|
1978年
/ 27卷
/ 04期
关键词
:
D O I
:
10.1109/TR.1978.5220381
中图分类号
:
TP3 [计算技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
引用
收藏
页码:298 / 300
页数:3
相关论文
共 6 条
[1]
RELIABILITY OF A SPECIAL CLASS OF REDUNDANT SYSTEMS
[J].
ANDERSON, DE
论文数:
0
引用数:
0
h-index:
0
机构:
Univac, Division of Sperry Rand Corporation, St. Paul
ANDERSON, DE
.
IEEE TRANSACTIONS ON RELIABILITY,
1969,
R 18
(01)
:21
-&
[2]
A TECHNIQUE FOR ANALYSIS OF REPAIRABLE REDUNDANT SYSTEMS
[J].
CHRISTIAANSE, WR
论文数:
0
引用数:
0
h-index:
0
CHRISTIAANSE, WR
.
IEEE TRANSACTIONS ON RELIABILITY,
1970,
R 19
(02)
:53
-+
[3]
KULSHRESTHA DK, 1966, OPSEARCH, V3, P139
[4]
2-UNIT STANDBY-REDUNDANT SYSTEM WITH IMPERFECT SWITCHOVER
[J].
OSAKI, S
论文数:
0
引用数:
0
h-index:
0
OSAKI, S
.
IEEE TRANSACTIONS ON RELIABILITY,
1972,
R 21
(01)
:20
-&
[5]
SOME RELIABILITY CHARACTERISTICS OF A STAND-BY REDUNDANT EQUIPMENT WITH IMPERFECT SWITCHING
[J].
PRAKASH, S
论文数:
0
引用数:
0
h-index:
0
PRAKASH, S
.
MICROELECTRONICS RELIABILITY,
1970,
9
(05)
:419
-&
[6]
NAPS03248A DOC
←
1
→
共 6 条
[1]
RELIABILITY OF A SPECIAL CLASS OF REDUNDANT SYSTEMS
[J].
ANDERSON, DE
论文数:
0
引用数:
0
h-index:
0
机构:
Univac, Division of Sperry Rand Corporation, St. Paul
ANDERSON, DE
.
IEEE TRANSACTIONS ON RELIABILITY,
1969,
R 18
(01)
:21
-&
[2]
A TECHNIQUE FOR ANALYSIS OF REPAIRABLE REDUNDANT SYSTEMS
[J].
CHRISTIAANSE, WR
论文数:
0
引用数:
0
h-index:
0
CHRISTIAANSE, WR
.
IEEE TRANSACTIONS ON RELIABILITY,
1970,
R 19
(02)
:53
-+
[3]
KULSHRESTHA DK, 1966, OPSEARCH, V3, P139
[4]
2-UNIT STANDBY-REDUNDANT SYSTEM WITH IMPERFECT SWITCHOVER
[J].
OSAKI, S
论文数:
0
引用数:
0
h-index:
0
OSAKI, S
.
IEEE TRANSACTIONS ON RELIABILITY,
1972,
R 21
(01)
:20
-&
[5]
SOME RELIABILITY CHARACTERISTICS OF A STAND-BY REDUNDANT EQUIPMENT WITH IMPERFECT SWITCHING
[J].
PRAKASH, S
论文数:
0
引用数:
0
h-index:
0
PRAKASH, S
.
MICROELECTRONICS RELIABILITY,
1970,
9
(05)
:419
-&
[6]
NAPS03248A DOC
←
1
→