STRESS-VOIDING OF NARROW CONDUCTOR LINES

被引：5

作者：

YOST, FG ^{[1
]}

CAMPBELL, FE ^{[1
]}

机构：

[1] SANDIA NATL LABS,DIV SAFETY & RELIABIL ANAL,ALBUQUERQUE,NM 87185

来源：

IEEE CIRCUITS AND DEVICES MAGAZINE | 1990年 / 6卷 / 03期

关键词：

D O I：

10.1109/101.55334

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：40 / 44

页数：5

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