INVESTIGATION OF THE ELECTRONIC EFFECTS OF DISLOCATIONS BY STEM

被引：31

作者：

PENNYCOOK, SJ

机构：

来源：

ULTRAMICROSCOPY | 1981年 / 7卷 / 01期

关键词：

D O I：

10.1016/0304-3991(81)90027-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：99 / 104

页数：6

共 32 条

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