ATOMIC-FORCE MICROSCOPIC STUDY OF RUBBED POLYIMIDE FILMS

被引:62
作者
ZHU, YM [1 ]
WANG, L [1 ]
LU, ZH [1 ]
WEI, Y [1 ]
CHEN, XX [1 ]
TANG, JH [1 ]
机构
[1] NANJING ELECTR DEVICES INST,LIQUID CRYSTAL GRP,NANJING 210016,PEOPLES R CHINA
关键词
D O I
10.1063/1.113069
中图分类号
O59 [应用物理学];
学科分类号
摘要
Rubbed polyimide films have been studied by atomic force microscopy from micrometer to nanometer scales. On a large scale, oriented scratches and microstructures due to rubbing have been observed, while on a nanometer scale, oriented polyimide aggregates are visible. The alignment of liquid crystals on these films is thus discussed.
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页码:49 / 51
页数:3
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