THE ULTIMATE LIMITS OF SENSITIVITY OF LEAD SULFIDE AND TELLURIDE PHOTO-CONDUCTIVE DETECTORS

被引：23

作者：

MOSS, TS

机构：

来源：

关键词：

D O I：

10.1364/JOSA.40.000603

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：603 / 607

页数：5

共 11 条

[1] ON THE ULTIMATE SENSITIVITY AND PRACTICAL PERFORMANCE OF RADIATION DETECTORS
FELLGETT, PB
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (11) : 970 - 976
[2] FOWLER RH, 1936, STATISTICAL MECHANIC
[3] GIBSON AF, 1948, TRE L351AFG MEM
[4] JONES RC, 1947, J OPT SOC AM, V37, P879
[5] MOSS TS, 1949, P PHYS SOC LONDON B, V62, P741
[6] LEAD TELLURIDE CELLS FOR INFRA-RED SPECTROSCOPY
SIMPSON, O
SUTHERLAND, GBBM
BLACKWELL, DE
[J]. NATURE, 1948, 161 (4086) : 281 - 281
[7] THE EFFECT OF ROOM TEMPERATURE RADIATION ON THE INFRA-RED RESPONSE OF LEAD TELLURIDE PHOTOCONDUCTORS
SIMPSON, O
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (347): : 486 - 487
[8] WATTS BM, COMMUNICATION
[9] WATTS BN, 1949, P PHYS SOC A, V62, P457
[10] YOUNG A, 1949, TRE21 MEM