A PROGRAM TO CALCULATE VARIANCE OF X-RAY LINE PROFILES

被引：7

作者：

HILLEARD, RJ

WEBSTER, JA

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1969年 / 2卷

关键词：

D O I：

10.1107/S0021889869006960

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The variance of a line profile as a measure of the breadth of the line has recently been given a sound theoretical basis and a computer program is described to perform the enormous amount of computation required in variance analysis.

引用

页码：193 / &

共 11 条

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