ULTRAVIOLET-LIGHT-INDUCED OXIDE FORMATION ON GAAS-SURFACES

被引:37
作者
LU, Z
SCHMIDT, MT
PODLESNIK, DV
YU, CF
OSGOOD, RM
机构
[1] Microelectronics Sciences Laboratories, Columbia University, New York
[2] IBM East Fishkill, Z340, Hopewell Junction
关键词
D O I
10.1063/1.459325
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present a study of deep-ultraviolet-light-enhanced (4.1 < hν< 5.1 eV) oxygen reactions on GaAs from submonolayer to several monolayers coverage. The reaction is nonthermal and does not involve gas-phase excitation or dissociation of O2. Our experiments show a distinct wavelength and coverage dependence for the photoenhancement. X-ray photoelectron spectroscopy has been used to examine the chemical nature of the oxygen adsorbate and the GaAs oxides in order to find intermediate reaction species and evidence of the reaction pathways. The roles of photons and photogenerated carriers in the reaction enhancement mechanism are discussed. The results indicate that a mechanism based on photoemission of electrons into the growing oxide film is most in accord with the experimental observations. Such electron emission would increase the field-driven transport of oxygen to the GaAs interface. © 1990 American Institute of Physics.
引用
收藏
页码:7951 / 7961
页数:11
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