MEASUREMENT OF SOFT-X-RAY MULTILAYER MIRROR REFLECTANCE AT NORMAL INCIDENCE USING LASER-PRODUCED PLASMAS

被引：25

作者：

TRAIL, JA ^{[1
]}

BYER, RL ^{[1
]}

BARBEE, TW ^{[1
]}

机构：

[1] UNIV CALIF LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94550

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 04期

关键词：

D O I：

10.1063/1.99490

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：269 / 271

页数：3

共 17 条

[1]

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[2] MOLYBDENUM-SILICON MULTILAYER MIRRORS FOR THE EXTREME ULTRAVIOLET [J].

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[4] INVESTIGATION OF A LASER-PRODUCED PLASMA VUV LIGHT-SOURCE [J].

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[5] LASER-PRODUCED CONTINUA FOR ABSORPTION-SPECTROSCOPY IN THE VUV AND XUV [J].

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[6] LASER-GENERATED PLASMA AS SOFT-X-RAY SOURCE [J].

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[7] IMAGING PERFORMANCE OF A NORMAL INCIDENCE SOFT-X-RAY TELESCOPE [J].

HENRY, JP ;

SPILLER, E ;

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APPLIED PHYSICS LETTERS, 1982, 40 (01) :25-27

[8] SOFT-X-RAY EMISSION FROM OMEGA-0, 2 OMEGA-0, AND 4 OMEGA-0 LASER-PRODUCED PLASMAS [J].

KODAMA, R ;

OKADA, K ;

IKEDA, N ;

MINEO, M ;

TANAKA, KA ;

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YAMANAKA, C .

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[9]

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[10]

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