THICKNESS DEPENDENT ANISOTROPIES IN ULTRATHIN AMORPHOUS CO80B20/AG MULTILAYER FILMS

被引:1
作者
HICKEN, RJ
RADO, GT
机构
[1] Department of Physics and Astronomy, The Johns Hopkins University, Baltimore
关键词
D O I
10.1016/0304-8853(92)91529-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ferromagnetic resonance (FMR) was used to study the anisotropies present in Co80B20/Ag multilayer films. The magnetic surface anisotropy constant K(S) was observed to have a constant negative value (favouring an in-plane orientation of the magnetization) for a Co80B20 layer thickness 2L > 20 angstrom, but then to decrease in magnitude for 2L < 20 angstrom. We propose that this behaviour can be accounted for by a magnetostrictive surface anisotropy mechanism. A large deposition induced in-plane volume anisotropy was also observed.
引用
收藏
页码:1743 / 1744
页数:2
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