CARRIER HEATING EFFECTS IN JUNCTIONS AT VERY LOW CURRENTS

被引：6

作者：

BERZ, F ^{[1
]}

机构：

[1] MULLARD RES LABS,REDHILL,SURREY,ENGLAND

来源：

关键词：

D O I：

10.1016/0038-1101(73)90208-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1067 / 1071

页数：5

共 6 条

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[3]

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LARKHOROVITZ, K .

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[5]

MILLER JCP, 1965, HDB MATH FUNCTIONS, pCH19

[6] DIFFUSION OF HOT AND COLD ELECTRONS IN SEMICONDUCTOR BARRIERS [J].

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