COMMENTS ON INDEPENDENCE, MEASUREMENT COMPLEXITY, AND CLASSIFICATION PERFORMANCE

被引：3

作者：

DUIN, RPW ^{[1
]}

机构：

[1] DELFT UNIV TECHNOL, DEPT APPL PHYS, DELFT, NETHERLANDS

来源：

IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS | 1977年 / 7卷 / 07期

关键词：

D O I：

10.1109/TSMC.1977.4309770

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：559 / 560

页数：2

共 4 条

[1] COMMENTS ON MEAN ACCURACY OF STATISTICAL PATTERN RECOGNIZERS [J].

ABEND, K ;

HARLEY, TJ ;

CHANDRASEKARAN, B ;

HUGHES, GF .

CHANDRASEKARAN, B ;

JAIN, AK .

IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, 1975, SMC5 (02) :240-244

[3] INDEPENDENCE OF MEASUREMENTS AND MEAN RECOGNITION ACCURACY [J].

CHANDRASEKARAN, B .

[4] ON MEAN ACCURACY OF STATISTICAL PATTERN RECOGNIZERS [J].

HUGHES, GF .