A FITTING METHOD FOR THE DETERMINATION OF CRYSTALLINITY BY MEANS OF X-RAY-DIFFRACTION

被引：26

作者：

POLIZZI, S ^{[1
]}

FAGHERAZZI, G ^{[1
]}

BENEDETTI, A ^{[1
]}

BATTAGLIARIN, M ^{[1
]}

机构：

[1] SHIZUOKA UNIV,FAC SCI,DEPT PHYS,OYA,SHIZUOKA 422,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1990年 / 23卷

关键词：

D O I：

10.1107/S0021889890004939

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：359 / 365

页数：7

共 25 条

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[6] APPLICATIONS OF FITTING TECHNIQUES TO THE WARREN-AVERBACH METHOD FOR X-RAY-LINE BROADENING ANALYSIS [J].

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