A QUASI-BAYES ESTIMATE OF THE FAILURE INTENSITY OF A RELIABILITY-GROWTH MODEL

被引：23

作者：

HIGGINS, JJ ^{[1
]}

TSOKOS, CP ^{[1
]}

机构：

[1] UNIV S FLORIDA,DEPT MATH,TAMPA,FL 33620

来源：

关键词：

D O I：

10.1109/TR.1981.5221176

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：471 / 475

页数：5

共 5 条

[1]

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[3] PREDICITION INTERVALS FOR WEIBULL PROCESS [J].

ENGELHARDT, M ;

BAIN, LJ .

[4] CONFIDENCE BOUNDS ON PARAMETERS OF WEIBULL PROCESS [J].

FINKELSTEIN, JM .

[5] SOME RESULTS ON INFERENCE FOR WEIBULL PROCESS [J].

LEE, L ;

LEE, SK .