SECONDARY ION MASS-SPECTROMETRY OF INORGANIC SALTS - NITRITES-NITRATES

[1] AYLWARD GH, 1971, SI CHEM DATA, P16

[2] Benninghoven A., 1976, Critical Reviews in Solid State Sciences, V6, P291, DOI 10.1080/10408437608243561

[3] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[4] MARIEN J, 1979, B SOC CHIM BELG, V88, P115

[5] MARIEN J, UNPUBLISHED

[6] MARIEN J, 1979, 2ND P INT C SEC ION, P139

[7] STRUCTURE SENSITIVE FACTORS IN MOLECULAR CLUSTER FORMATION BY ION-BOMBARDMENT OF SINGLE-CRYSTAL SURFACES [J]. SURFACE SCIENCE, 1978, 78 (02) : 467 - 477

[1] AYLWARD GH, 1971, SI CHEM DATA, P16

[2] Benninghoven A., 1976, Critical Reviews in Solid State Sciences, V6, P291, DOI 10.1080/10408437608243561

[3] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[4] MARIEN J, 1979, B SOC CHIM BELG, V88, P115

[5] MARIEN J, UNPUBLISHED

[6] MARIEN J, 1979, 2ND P INT C SEC ION, P139

[7] STRUCTURE SENSITIVE FACTORS IN MOLECULAR CLUSTER FORMATION BY ION-BOMBARDMENT OF SINGLE-CRYSTAL SURFACES [J]. SURFACE SCIENCE, 1978, 78 (02) : 467 - 477