Ideal-Real Semiconducting Glass and Low-High Conductivity Transition

被引:15
作者
Boeer, K. W. [1 ]
机构
[1] Univ Delaware, Dept Phys, Newark, DE 19716 USA
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1970年 / 3卷 / 04期
关键词
D O I
10.1002/pssa.19700030419
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Potential perturbations caused by about 10(20) cm(-3) of charged defects are characteristic for real glasses and cause a marked reduction of the mobility near the mobility edge as compared to ideal glasses. The conduction mechanism in real glasses is suggested to be carrier drift at a conductivity edge over barriers provided by Coulomb- repulsive defects. Evidence is given by analysis of numerous optical and electrical properties that the carrier mobility is of the order of 10(2) cm(2)/Vs in spite of a Hall mobility which is at least three orders of magnitude smaller. A simple change of the conduction mechanism, as the barriers are rendered ineffective at elevated temperatures, during the switching transition is suggested for explanation of the Ovshinsky effect.
引用
收藏
页码:1007 / 1018
页数:12
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