THE TEMPERATURE-DEPENDENCE OF SUPERLATTICE SPOTS IN ELECTRON-DIFFRACTION PATTERNS OF THIN-LAYERS OF AGXTIS2 FORMED BY ELECTROINTERCALATION

被引：2

作者：

RAJORA, OS ^{[1
]}

CURZON, AE ^{[1
]}

机构：

[1] SIMON FRASER UNIV,DEPT PHYS,BURNABY V5A 1S6,BC,CANADA

来源：

THIN SOLID FILMS | 1988年 / 164卷

关键词：

D O I：

10.1016/0040-6090(88)90113-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：81 / 84

页数：4

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