TYPE-I INTENSITY MEASUREMENT PROJECT

被引：15

作者：

DENNE, WA

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1972年 / A 28卷 / MAR1期

关键词：

D O I：

10.1107/S0567739472000415

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：192 / &

共 20 条

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ZALKIN, A .

ACTA CRYSTALLOGRAPHICA, 1967, 22 :1-&

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BUSING, WR ;

LEVY, HA .

ACTA CRYSTALLOGRAPHICA, 1957, 10 (03) :180-182

[5]

DAVIES DB, TO BE PUBLISHED

[6] DEPENDENCE OF X-RAY BEAM HOMOGENEITY ON ABSORPTION BY TARGET [J].

DENNE, WA .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1970, A 26 :154-&

[7] NEW CONCEPT IN GONIOMETER HEAD DESIGN [J].

DENNE, WA .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (FEB1) :60-&

[8]

DENNE WA, 1970, ACT CRYS A, V26, P666

[9] AN ACCURATE ABSOLUTE SCATTERING FACTOR FOR SILICON [J].

HART, M ;

MILNE, AD .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 :134-&

[10] MEASUREMENT OF INTEGRATED X-RAY INTENSITIES OF GE AND SI [J].

JENNINGS, LD .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (13) :5038-&

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