DENSITY OF SILICON-CRYSTALS

被引:11
作者
TANAKA, M [1 ]
PEUTO, A [1 ]
机构
[1] CNR,IST METROL G COLONNETTI,I-10135 TURIN,ITALY
关键词
D O I
10.1088/0026-1394/31/3/008
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Measurements of silicon crystal density for the determination of the Avogadro constant are reviewed. Volume, mass and hydrostatic-weighing measurements are considered from the technical standpoints of error sources and uncertainty of measurement. The outlook on the possibility of achieving experimental uncertainties of less than 10(-7) is described. Attention is paid to the necessity of reducing the sources of uncertainty in the density arising from the surface, such as silica layers and damaged crystalline layers.
引用
收藏
页码:219 / 230
页数:12
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