STUDY OF SURFACE-STRUCTURE OF CATALYTIC CARBON FILAMENTS BY SECONDARY-ION MASS-SPECTROSCOPY

被引：3

作者：

IVANOV, VP

FENELONOV, VB

AVDEEVA, LB

GONCHAROVA, OV

机构：

[1] Boreskov Institute of Catalysis, Novosibirsk

来源：

REACTION KINETICS AND CATALYSIS LETTERS | 1994年 / 53卷 / 01期

关键词：

D O I：

10.1007/BF02070131

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The SIMS method has been used for studying the time dependent intensities of the secondary ions H2O+, O+, CH3+ and C+ under Ar+ bombardment of two CCF samples with different packing of filaments. The thickness of defect layers is estimated from the median of secondary ions distribution.

引用

页码：197 / 203

页数：7

共 6 条

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[2]

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[3]

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BEITAT, U ;

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[6]

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