X-RAY-IMAGING WITH A CHARGE-COUPLED DEVICE FABRICATED ON A HIGH-RESISTIVITY SILICON SUBSTRATE

被引：15

作者：

PECKERAR, MC

MCCANN, DH

YU, L

机构：

[1] WESTINGHOUSE ELECT CORP,BALTIMORE,MD 21203

[2] NIH,BETHESDA,MD 20014

来源：

关键词：

D O I：

10.1063/1.92561

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：55 / 57

页数：3

共 9 条

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CRISS, JW
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[2] SENSITIVITY OF X-RAY FILM .2. KODAK NO-SCREEN FILM IN 1-100-KEV REGION
DOZIER, CM
BROWN, DB
BIRKS, LS
LYONS, PB
BENJAMIN, RF
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (08) : 3732 - 3739
[3] GRIFFITHS RE, 1980, P SPIE, V244, P124
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[5] DIRECT SOFT-X-RAY RESPONSE OF A CHARGE-COUPLED IMAGE SENSOR
KOPPEL, LN
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1977, 48 (06) : 669 - 672
[6] McCann D. M., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V217, P118
[7] X-RAY SENSITIVITY OF A CHARGE-COUPLED-DEVICE ARRAY
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BAKER, WD
NAGEL, DJ
[J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (06) : 2565 - 2569
[8] PECKERAR MC, 1979, P IEEE INT ELECTRON, P144
[9] RENDA G, 1975, S CHARGE COUPLED TEC, P91