NEW MODEL OF BOND DIFFRACTOMETER FOR PRECISE DETERMINATION OF LATTICE-PARAMETERS AND THERMAL-EXPANSION OF SINGLE-CRYSTALS

被引：49

作者：

LUKASZEWICZ, K

KUCHARCZYK, D

MALINOWSKI, M

PIETRASZKO, A

机构：

来源：

KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1978年 / 13卷 / 05期

关键词：

D O I：

10.1002/crat.19780130516

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：561 / 567

页数：7

共 8 条

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[2] BARUS RL, 1967, MAT RES B, V2, P273
[3] X-RAY WAVELENGTHS
BEARDEN, JA
[J]. REVIEWS OF MODERN PHYSICS, 1967, 39 (01) : 78 - &
[4] PRECISION LATTICE CONSTANT DETERMINATION
BOND, WL
[J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818
[5] BOND WL, 1975, ACTA CRYSTALLOGR A, V31, P698, DOI 10.1107/S0567739475001465
[6] SPECIMEN AND BEAM TILT ERRORS IN BONDS METHOD OF LATTICE PARAMETER DETERMINATION
BURKE, J
TOMKEIEF.MV
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 683 - &
[7] LISOIWAN WI, 1969, PRIBORY TECHNIKA EKS, V4, P164
[8] RATUSZNA A, UNPUBLISHED