X-RAY COMPTON SCATTERING FOR ALUMINUM

[1] ALEXOPOULOS K, 1949, PHILOS MAG, V40, P115

[2] Alexopoulos K, 1938, PHYS Z, V39, P688

[3] BEWILOGUA L, 1932, PHYS Z, V32, P740

[4] A correspondence principle in the compton effect [J]. PHYSICAL REVIEW, 1926, 27 (04): : 362 - 372

[5] Brindley GW, 1936, PHILOS MAG, V21, P778

[6] Atomic scattering factors of aluminium, potassium chloride and copper for X rays [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY, 1938, 50 : 96 - 107

[7] A precision x-ray spectrometer and the wave length of MoK alpha(1) [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1931, 2 (07) : 365 - 376

[8] The determination of electron distributions from measurements of scattered x-rays [J]. PHYSICAL REVIEW, 1930, 35 (08): : 0925 - 0938

[9] COMPTON AH, 1935, XRAYS THEORY EXPT, P782

[10] X-RAY MEASUREMENT OF ORDER IN SINGLE CRYSTALS OF (CU3AU) [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (01) : 24 - 29

[1] ALEXOPOULOS K, 1949, PHILOS MAG, V40, P115

[2] Alexopoulos K, 1938, PHYS Z, V39, P688

[3] BEWILOGUA L, 1932, PHYS Z, V32, P740

[4] A correspondence principle in the compton effect [J]. PHYSICAL REVIEW, 1926, 27 (04): : 362 - 372

[5] Brindley GW, 1936, PHILOS MAG, V21, P778

[6] Atomic scattering factors of aluminium, potassium chloride and copper for X rays [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY, 1938, 50 : 96 - 107

[7] A precision x-ray spectrometer and the wave length of MoK alpha(1) [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1931, 2 (07) : 365 - 376

[8] The determination of electron distributions from measurements of scattered x-rays [J]. PHYSICAL REVIEW, 1930, 35 (08): : 0925 - 0938

[9] COMPTON AH, 1935, XRAYS THEORY EXPT, P782

[10] X-RAY MEASUREMENT OF ORDER IN SINGLE CRYSTALS OF (CU3AU) [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (01) : 24 - 29