DIRECT OBSERVATIONS OF ANNEALING OF STACKING-FAULT TETRAHEDRA IN GOLD USING HIGH-VOLTAGE ELECTRON-MICROSCOPY

被引：3

作者：

FRASER, HL

LORETTO, MH

SMALLMAN, RE

机构：

[1] UNIV ILLINOIS,DEPT MET & MIN ENGN,URBANA,IL 61801

[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

[3] UNIV BIRMINGHAM,DEPT PHYS MET & SCI MAT,BIRMINGHAM B15 2TT,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE | 1973年 / 28卷 / 05期

关键词：

D O I：

10.1080/14786437308220967

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1043 / 1056

页数：14

共 18 条

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[7] GROWTH OF ANNEALING OF STACKING-FAULT TETRAHEDRA IN GOLD [J].

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SIEGEL, RW .

PHILOSOPHICAL MAGAZINE, 1972, 26 (03) :637-&

[8] MEASUREMENT OF STACKING-FAULT ENERGY OF GOLD USING WEAK-BEAM TECHNIQUE OF ELECTRON-MICROSCOPY [J].

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PHILOSOPHICAL MAGAZINE, 1972, 26 (03) :747-&

[9] ENERGIES OF STACKING-FAULT TETRAHEDRA IN FCC METALS [J].

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[10] GROWTH AND ANNEALING OF STACKING FAULT TETRAHEDRA [J].

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