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AN EMPIRICAL ELECTRON SPECTROMETER TRANSMISSION FUNCTION FOR APPLICATIONS IN QUANTITATIVE XPS
被引:32
作者
:
HEMMINGER, CS
论文数:
0
引用数:
0
h-index:
0
机构:
VG SCI,E GRINSTEAD RH19 1UB,W SUSSEX,ENGLAND
HEMMINGER, CS
LAND, TA
论文数:
0
引用数:
0
h-index:
0
机构:
VG SCI,E GRINSTEAD RH19 1UB,W SUSSEX,ENGLAND
LAND, TA
CHRISTIE, A
论文数:
0
引用数:
0
h-index:
0
机构:
VG SCI,E GRINSTEAD RH19 1UB,W SUSSEX,ENGLAND
CHRISTIE, A
HEMMINGER, JC
论文数:
0
引用数:
0
h-index:
0
机构:
VG SCI,E GRINSTEAD RH19 1UB,W SUSSEX,ENGLAND
HEMMINGER, JC
机构
:
[1]
VG SCI,E GRINSTEAD RH19 1UB,W SUSSEX,ENGLAND
[2]
UNIV CALIF IRVINE,INST SURFACE & INTERFACE SCI,DEPT CHEM,IRVINE,CA 92717
来源
:
SURFACE AND INTERFACE ANALYSIS
|
1990年
/ 15卷
/ 05期
关键词
:
D O I
:
10.1002/sia.740150505
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
The use of XPS data for accurate elemental quantitation requires that the transmission function of the electron spectrometer be known. Often, the dependence on electron kinetic energy (Ek) and spectrometer pass energy (Ea) are treated as separable functions. This is inadequate for the comparison of data taken with different pass energies. We have measured the variation of signal intensity as a function of Ea and Ek using the VG Escalab MK II spectrometer under constant analyzer energy conditions. Results from three independent laboratories on a variety of samples are in good agreement. The combined data have been used to develop an empirical formula that relates the signal intensity to the electron kinetic energy and spectrometer pass energy. The non‐separable relationship that we obtain is of the form (Formula Presented.) Relative sensitivity factors used for XPS quantitation depend on the instrument transmission function. It is not adequate to use an invariant table of factors for all analyser conditions, as is assumed by many XPS data systems. The above empirical formula leads to simple calculations of elemental sensitivity factors at different spectrometer pass energies. It will be demonstrated that this can facilitate comparison of small‐area and large‐area XPS data and quantitative analysis of complex materials where it is desirable to measure minor components at high pass energy. Copyright © 1990 John Wiley & Sons Ltd.
引用
收藏
页码:323 / 327
页数:5
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CALCULATED CORE-LEVEL SENSITIVITY FACTORS FOR QUANTITATIVE XPS USING AN HP5950B SPECTROMETER
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共 7 条
[1]
SCANNING AUGER MICROSCOPY - RESOLUTION IN TIME, ENERGY AND SPACE
[J].
BROOKER, AD
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Surrey, Guildford, Engl, Univ of Surrey, Guildford, Engl
BROOKER, AD
;
CASTLE, JE
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Surrey, Guildford, Engl, Univ of Surrey, Guildford, Engl
CASTLE, JE
.
SURFACE AND INTERFACE ANALYSIS,
1986,
8
(01)
:13
-19
[2]
CALCULATED CORE-LEVEL SENSITIVITY FACTORS FOR QUANTITATIVE XPS USING AN HP5950B SPECTROMETER
[J].
ELLIOTT, I
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH,DEPT BIOENGN,SURFACE ANAL LAB,SALT LAKE CITY,UT 84112
ELLIOTT, I
;
DOYLE, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV UTAH,DEPT BIOENGN,SURFACE ANAL LAB,SALT LAKE CITY,UT 84112
DOYLE, C
;
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论文数:
0
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h-index:
0
机构:
UNIV UTAH,DEPT BIOENGN,SURFACE ANAL LAB,SALT LAKE CITY,UT 84112
ANDRADE, JD
.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
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[3]
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h-index:
0
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;
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0
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SURFACE AND INTERFACE ANALYSIS,
1982,
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(05)
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-226
[4]
Seah M. P., 1980, Surface and Interface Analysis, V2, P222, DOI 10.1002/sia.740020607
[5]
QUANTITATIVE XPS - THE CALIBRATION OF SPECTROMETER INTENSITY ENERGY RESPONSE FUNCTIONS .2. RESULTS OF INTERLABORATORY MEASUREMENTS FOR COMMERICAL INSTRUMENTS
[J].
SEAH, MP
论文数:
0
引用数:
0
h-index:
0
机构:
NPL, Div of Materials Applications,, Teddington, Engl, NPL, Div of Materials Applications, Teddington, Engl
SEAH, MP
;
JONES, ME
论文数:
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机构:
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JONES, ME
;
ANTHONY, MT
论文数:
0
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h-index:
0
机构:
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ANTHONY, MT
.
SURFACE AND INTERFACE ANALYSIS,
1984,
6
(05)
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-254
[6]
QUANTITATIVE XPS - THE CALIBRATION OF SPECTROMETER INTENSITY ENERGY RESPONSE FUNCTIONS .1. THE ESTABLISHMENT OF REFERENCE PROCEDURES AND INSTRUMENT BEHAVIOR
[J].
SEAH, MP
论文数:
0
引用数:
0
h-index:
0
SEAH, MP
;
ANTHONY, MT
论文数:
0
引用数:
0
h-index:
0
ANTHONY, MT
.
SURFACE AND INTERFACE ANALYSIS,
1984,
6
(05)
:230
-241
[7]
EMPIRICAL ATOMIC SENSITIVITY FACTORS FOR QUANTITATIVE-ANALYSIS BY ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS
[J].
WAGNER, CD
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
WAGNER, CD
;
DAVIS, LE
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
DAVIS, LE
;
ZELLER, MV
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
ZELLER, MV
;
TAYLOR, JA
论文数:
0
引用数:
0
h-index:
0
机构:
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;
RAYMOND, RH
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
RAYMOND, RH
;
GALE, LH
论文数:
0
引用数:
0
h-index:
0
机构:
PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344
GALE, LH
.
SURFACE AND INTERFACE ANALYSIS,
1981,
3
(05)
:211
-225
←
1
→