PHONONS IN A SURFACE WITH A MASS-DEFECT - AS-SI(111)(1 X-1)

被引:11
作者
DOAK, RB
NGUYEN, DB
机构
[1] AT and T Bell Laboratories, Murray Hill
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 06期
关键词
D O I
10.1103/PhysRevB.41.3578
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using inelastic helium scattering, we have made the first measurements of surface-phonon dispersion relations in a capped semiconductor, As:Si(111)(1×1). The simple, single-layer surface modification introduced by the As atoms gives rise to two surface acoustic modes. We suggest that such surfaces present a unique opportunity for studying the effect on the surface lattice dynamics of surface modification (i.e., a nearly ideal mass defect) and that the results may provide general insight into the dynamical behavior of clean as well as adsorbate-covered surfaces. © 1990 The American Physical Society.
引用
收藏
页码:3578 / 3581
页数:4
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