ANISOTROPIC EFFECTS IN ELLIPSOMETRY OF BUILT-UP FILMS AND DETERMINATION OF THEIR OPTICAL-CONSTANTS

被引：17

作者：

TOMAR, MS ^{[1
]}

SRIVASTAVA, VK ^{[1
]}

机构：

[1] UNIV ROORKEE, DEPT PHYS, ROORKEE, INDIA

来源：

THIN SOLID FILMS | 1973年 / 15卷 / 02期

关键词：

D O I：

10.1016/0040-6090(73)90044-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：207 / 215

页数：9

共 18 条

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[6]

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[9]

LANGMUIR I, 1939, P ROY SOC LOND A MAT, P1

[10] SOME OBSERVATIONS ON USE OF ELLIPTICALLY POLARIZED LIGHT TO STUDY METAL SURFACES [J].

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