NON-ARRHENIUS REORIENTATION KINETICS FOR THE B-H COMPLEX IN SI - EVIDENCE FOR THERMALLY ASSISTED TUNNELING

被引:48
作者
CHENG, YM [1 ]
STAVOLA, M [1 ]
机构
[1] LEHIGH UNIV,DEPT PHYS,BETHLEHEM,PA 18015
关键词
D O I
10.1103/PhysRevLett.73.3419
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The B-H complex in Si can be aligned by stress and reorients with an activation energy of roughly 0.2 eV. We combine new measurements of the reorientation kinetics of the B-H complex made by the stress-induced dichroism technique with previous internal friction results to show that the reorientation kinetics are non-Arrhenius. These results support Stoneham's suggestion Phys. Rev. Lett. 63 1027 1989 that reorientation occurs by thermally assisted tunneling. We have also discovered the remarkable fact that the reorientation rate for B-D is greater than that of B-H for T>57 K. © 1994 The American Physical Society.
引用
收藏
页码:3419 / 3422
页数:4
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