DEFECT PRODUCTION BY ELECTRON-EXCITATION IN CU AND AG

被引：13

作者：

IWASE, A ^{[1
]}

IWATA, T ^{[1
]}

NIHIRA, T ^{[1
]}

机构：

[1] IBARAKI UNIV, FAC ENGN, HITACHI, IBARAKI 316, JAPAN

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1992年 / 61卷 / 11期

关键词：

DEFECT PRODUCTION; ELECTRON EXCITATION; COPPER AND SILVER; ION IRRADIATION; MUTUAL COULOMB REPULSION OF POSITIVE IONS;

D O I：

10.1143/JPSJ.61.3878

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

It has been found in ion-irradiated Cu and Ag thin foils that lattice defects are produced not only through elastic collisions, but also through a process strongly associated with electronic stopping power S(e). In the latter process, the defect production cross section is proportional to S(e)1.7 in Cu and S(e)1.5 in Ag. The nearly quadratic dependence of the defect production cross section on S(e) suggests that the mutual Coulomb repulsion of ions positively charged by electron excitation causes the defect production in Cu and Ag.

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收藏

页码：3878 / 3882

页数：5

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