SURFACE-ANALYSIS OF SINGLE-CRYSTALS IN THE BI-SR-CA-CU-O SYSTEM BY LOW-ENERGY ELECTRON-DIFFRACTION AND AUGER-ELECTRON SPECTROSCOPY

被引:17
作者
NAKANISHI, S
FUKUOKA, N
NAKAHIGASHI, K
KOGACHI, M
SASAKURA, H
MINAMIGAWA, S
YANASE, A
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1989年 / 28卷 / 01期
关键词
D O I
10.1143/JJAP.28.L71
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:L71 / L74
页数:4
相关论文
共 12 条
[1]   APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J].
BRUNDLE, CR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :212-224
[2]   CRYSTAL-GROWTH AND SUPERCONDUCTING PHASE FORMATION FROM BI-CA-SR-CU-O LIQUIDS [J].
CISZEK, TF ;
GORAL, JP ;
EVANS, CD ;
KATAYAMAYOSHIDA, H .
JOURNAL OF CRYSTAL GROWTH, 1988, 91 (03) :312-317
[3]   STRUCTURE-ANALYSIS OF THE BI2(SR,CA)3CU2O8.2 SUPERCONDUCTING CRYSTAL BASED ON THE COMPUTER-SIMULATION OF HRTEM IMAGES [J].
HORIUCHI, S ;
MAEDA, H ;
TANAKA, Y ;
MATSUI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (07) :L1172-L1174
[4]   SINGLE-CRYSTAL X-RAY STRUCTURE-ANALYSIS OF BI2(SR, CA)2CUOX AND BI2(SR,CA)3CU2OX SUPERCONDUCTORS [J].
IMAI, K ;
NAKAI, I ;
KAWASHIMA, T ;
SUENO, S ;
ONO, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (09) :L1661-L1664
[5]   A NEW HIGH-TC OXIDE SUPERCONDUCTOR WITHOUT A RARE-EARTH ELEMENT [J].
MAEDA, H ;
TANAKA, Y ;
FUKUTOMI, M ;
ASANO, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (02) :L209-L210
[6]   HIGH-RESOLUTION ELECTRON-MICROSCOPY OF MODULATED STRUCTURE IN THE NEW HIGH-TC SUPERCONDUCTORS OF THE BI-SR-CA-CU-O SYSTEM [J].
MATSUI, Y ;
MAEDA, H ;
TANAKA, Y ;
HORIUCHI, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (03) :L361-L364
[7]   SINGLE-CRYSTAL GROWTH OF BI2(SR,CA)3-DCU2OX AND ITS SUPERCONDUCTIVITY [J].
NOMURA, S ;
YAMASHITA, T ;
YOSHINO, H ;
ANDO, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (07) :L1251-L1253
[8]  
ONODA N, 1988, JPN J APPL PHYS, V27, pL1665
[9]  
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
[10]   STRUCTURE-ANALYSIS OF HIGH-TC SUPERCONDUCTOR BI-CA-SR-CU-O BY PROCESSING OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES [J].
SHINDO, D ;
HIRAGA, K ;
HIRABAYASHI, M ;
KIKUCHI, M ;
SYONO, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (06) :L1018-L1021