EXCITED-STATE NONLINEARITY IN POLYTHIOPHENE THIN-FILMS INVESTIGATED BY THE Z-SCAN TECHNIQUE

被引：110

作者：

YANG, L

DORSINVILLE, R

WANG, QZ

YE, PX

ALFANO, RR

ZAMBONI, R

TALIANI, C

机构：

[1] CUNY,GRAD SCI,NEW YORK,NY 10031

[2] CNR,INST SPETT MOLEC,I-40126 BOLOGNA,ITALY

来源：

OPTICS LETTERS | 1992年 / 17卷 / 05期

关键词：

D O I：

10.1364/OL.17.000323

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Measurements of the third-order optical nonlinear susceptibility chi(3) have shown that nonlinearity around the single-photon absorption region is dominated by the saturation absorption in polythiophene thin films. The sign and the size of the real and the imaginary part of chi(3) have been measured at 532 nm to be -6.1 x 10(-9) and -1.9 x 10(-9) esu, respectively, by the Z-scan method.

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页码：323 / 325

页数：3

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