INTERFACE ROUGHENING AND RANDOM-FIELD INSTABILITIES IN ISING SYSTEMS IN 3 OR LESS DIMENSIONS

被引：81

作者：

BINDER, K ^{[1
]}

IMRY, Y ^{[1
]}

PYTTE, E ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1981年 / 24卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.24.6736

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6736 / 6739

页数：4

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