LOW-ENERGY ION-SCATTERING STUDIES OF POLYMER SURFACES

[1] Brongersma H H, 1978, Rev Sci Instrum, V49, P707, DOI 10.1063/1.1135598

[2] ANALYSIS OF OUTERMOST ATOMIC LAYER OF A SURFACE BY LOW-ENERGY ION SCATTERING [J]. SURFACE SCIENCE, 1973, 35 (01) : 393 - 412

[3] ION SCATTERING - SPECTROSCOPIC TOOL FOR STUDY OF OUTERMOST ATOMIC LAYER OF A SOLID SURFACE [J]. CHEMICAL PHYSICS LETTERS, 1972, 14 (03) : 380 - +

[4] BRONGERSMA HH, UNPUBLISHED

[5] CLARK DT, 1978, POLYM SURFACES, pCH16

[6] STATIC SECONDARY ION MASS-SPECTROMETRY OF POLYMER SYSTEMS [J]. ANALYTICAL CHEMISTRY, 1980, 52 (02) : 226 - 232

[7] EFFECT OF RESIDUAL OXYGEN ON FORMATION OF MOLECULAR IONS IN SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED PHYSICS, 1975, 8 (04): : 361 - 362

[8] Sanderson R. T., 1960, CHEM PERIODICITY

[9] SPARROW GA, 1976, IND RES SEP, P81

[10] SURFACE ANALYSIS WITH LOW-ENERGY ION SCATTERING [J]. APPLIED PHYSICS, 1976, 9 (04): : 261 - 275

[1] Brongersma H H, 1978, Rev Sci Instrum, V49, P707, DOI 10.1063/1.1135598

[2] ANALYSIS OF OUTERMOST ATOMIC LAYER OF A SURFACE BY LOW-ENERGY ION SCATTERING [J]. SURFACE SCIENCE, 1973, 35 (01) : 393 - 412

[3] ION SCATTERING - SPECTROSCOPIC TOOL FOR STUDY OF OUTERMOST ATOMIC LAYER OF A SOLID SURFACE [J]. CHEMICAL PHYSICS LETTERS, 1972, 14 (03) : 380 - +

[4] BRONGERSMA HH, UNPUBLISHED

[5] CLARK DT, 1978, POLYM SURFACES, pCH16

[6] STATIC SECONDARY ION MASS-SPECTROMETRY OF POLYMER SYSTEMS [J]. ANALYTICAL CHEMISTRY, 1980, 52 (02) : 226 - 232

[7] EFFECT OF RESIDUAL OXYGEN ON FORMATION OF MOLECULAR IONS IN SECONDARY ION MASS-SPECTROMETRY [J]. APPLIED PHYSICS, 1975, 8 (04): : 361 - 362

[8] Sanderson R. T., 1960, CHEM PERIODICITY

[9] SPARROW GA, 1976, IND RES SEP, P81

[10] SURFACE ANALYSIS WITH LOW-ENERGY ION SCATTERING [J]. APPLIED PHYSICS, 1976, 9 (04): : 261 - 275