SCANNING TUNNELING MICROSCOPY INVESTIGATION OF 2H-MOS2 - A LAYERED SEMICONDUCTING TRANSITION-METAL DICHALCOGENIDE

被引:11
作者
WEIMER, M [1 ]
KRAMAR, J [1 ]
BAI, C [1 ]
BALDESCHWIELER, JD [1 ]
KAISER, WJ [1 ]
机构
[1] CALTECH,JET PROP LAB,PASADENA,CA 91109
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期
关键词
D O I
10.1116/1.575408
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:336 / 337
页数:2
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