SURFACE STUDIES BY LOW-ENERGY ELECTRON-MICROSCOPY (LEEM) AND CONVENTIONAL UV PHOTOEMISSION ELECTRON-MICROSCOPY (PEEM)

被引：95

作者：

BAUER, E ^{[1
]}

MUNDSCHAU, M ^{[1
]}

SWIECH, W ^{[1
]}

TELIEPS, W ^{[1
]}

机构：

[1] SFB 126,D-3392 CLAUSTHAL ZELLERFE,FED REP GER

来源：

ULTRAMICROSCOPY | 1989年 / 31卷 / 01期

关键词：

D O I：

10.1016/0304-3991(89)90033-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：49 / 57

页数：9

相关论文

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